半导体消耗型测试硬件是半导体测试体系中不可或缺的重要组成部分，包括测试座、探针卡、负载板以及Kit、测试机连接组件等核心部件，主要用于设计验证测试（DVT）、晶圆测试（CP）、老化测试（Burn-in）、最终测试（FT）、系统级测试（SLT）等，承担着信号传导、接触连接、测试隔离与精度保障等关键功能。该类产品广泛应用于逻辑芯片、存储芯片、模拟芯片、功率器件、射频芯片、车规芯片等多个细分领域，在集成电路产业中具有高度的通用性与战略重要性。
全球半导体消耗型测试硬件市场规模于2025年达到527.9亿元，并预计将在未来几年保持快速增长，于2030年达到826.3亿元的规模，2026年至2030年间的年复合增长率预计将达8.6%。
Semiconductor consumable test hardware is a critical component of the semiconductor testing ecosystem. It includes products such as test sockets, probe cards, load boards, kits, and tester interface components, which are primarily used in design verification testing (DVT), wafer testing (CP), burn-in testing, final testing (FT), and system-level testing (SLT). These products provide essential functions including signal transmission, electrical contact, test isolation, and measurement accuracy. They are widely applied across logic, memory, analog, power, RF, and automotive semiconductor segments, and serve as broadly applicable infrastructure within the integrated circuit industry.
The global semiconductor consumable test hardware market reached RMB 52.79 billion in 2025 and is projected to grow to RMB 82.63 billion by 2030, reflecting a CAGR of 8.6% from 2026 to 2030.
